Author Details
Astaf’ev, S. B.
| Issue | Section | Title | File |
| Vol 69, No 3 (2024) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | Determination of the structure of weakly ordered films according to x-ray diffraction data | |
| Vol 68, No 1 (2023) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | FEATURES OF THE APPLICATION OF MATHEMATICAL OPTIMIZATION METHODS FOR THE STUDY OF NANOSTRUCTURES BASED ON X-RAY DIFFRACTION DATA |