Informaçao sobre o Autor
Astaf’ev, S. B.
Edição | Seção | Título | Arquivo |
Volume 69, Nº 3 (2024) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | Determination of the structure of weakly ordered films according to x-ray diffraction data | |
Volume 68, Nº 1 (2023) | ПОВЕРХНОСТЬ, ТОНКИЕ ПЛЕНКИ | FEATURES OF THE APPLICATION OF MATHEMATICAL OPTIMIZATION METHODS FOR THE STUDY OF NANOSTRUCTURES BASED ON X-RAY DIFFRACTION DATA |