Methodology for accounting of background in a neutron experiment with a 2D position-sensitive detector

Мұқаба

Дәйексөз келтіру

Толық мәтін

Ашық рұқсат Ашық рұқсат
Рұқсат жабық Рұқсат берілді
Рұқсат жабық Тек жазылушылар үшін

Аннотация

A methodology for measuring and taking into account the background in a neutron single-crystal experiment with a position-sensitive detector is proposed. This methodology makes it possible to increase the ratio of integrated intensities to the standard deviation I/σ(I) for the diffraction reflection intensities and include in the array of experimental data the weak reflections that previously did not meet the condition I/σ(I)>3, and were not taken into account in crystallographic calculations. The methodology was tested on experimental data during structural studies of a Cs4(HSO4)3(H2PO4) crystals on the MOND diffractometer at the IR-8 reactor of the National Research Center “Kurchatov Institute”.

Толық мәтін

Рұқсат жабық

Авторлар туралы

N. Isakova

National Research Center “Kurchatov Institute”

Хат алмасуға жауапты Автор.
Email: Isakova_NN@nrcki.ru
Ресей, 123182, Moscow, 1 Academika Kurchatova pl.

A. Kalyukanov

National Research Center “Kurchatov Institute”

Email: Isakova_NN@nrcki.ru
Ресей, 123182, Moscow, 1 Academika Kurchatova pl.

I. Makarova

National Research Center “Kurchatov Institute”

Email: Isakova_NN@nrcki.ru

Shubnikov Institute of Crystallography, Kurchatov Complex of Crystallography and Photonics

Ресей, Moscow, 119333, 59 Leninsky pr.

V. Em

National Research Center “Kurchatov Institute”

Email: Isakova_NN@nrcki.ru
Ресей, 123182, Moscow, 1 Academika Kurchatova pl.

Әдебиет тізімі

  1. Henn J., Meindl K. // Acta Cryst. A. 2010. V. 66. P. 676. https://doi.org/10.1107/s0108767310038808
  2. Калашникова В.И., Козодаев М.С. Детекторы элементарных частиц. М.: Наука, 1966. 407 с.
  3. Wilkinson C., Lehmann M.S., Meilleur F. et al. // J. Appl. Cryst. 2009. V. 42. P. 749. https://doi.org/10.1107/s0021889809024856
  4. Straasø T., Müter D., Sørensen H.O., Als-Nielsen J. // J. Appl. Cryst. 2013. V. 46. P. 663. https://doi.org/10.1107/s0021889813006511
  5. Калюканов А.И., Исакова Н.Н. // Тез. докл. конф. по использованию рассеяния нейтронов в исследовании конденсированных сред. Екатеринбург, 25–28 сентября 2023 г. С. 88.
  6. Boothroyd A.T. // Principles of Neutron Scattering from Condensed Matter. Oxford University Press, 2020. P. 343. https://doi.org/10.1093/oso/9780198862314.003.0010
  7. Kalambet Y.A., Kozmin Y.P., Samokhin A.S. // Analytics Russia. 2017. V. 5. P. 88. https://doi.org/10.22184/2227-572X.2017.36.5.88.101
  8. Makarova I., Grebenev V., Dmitricheva E. et al. // Acta Cryst. B. 2016. V. 72. P. 133. https://doi.org/10.1107/s2052520615023069
  9. Duisenberg A.J.M. // J. Appl. Cryst. 1992. V. 25. P. 92. https://doi.org/10.1107/S0021889891010634
  10. Duisenberg A.J.M., Kroon-Batenburg L.M.J., Schreurs A.M.M. // J. Appl. Cryst. 2003. V. 36. P. 220. https://doi.org/10.1107/S0021889802022628
  11. Petricek V., Dusek M., Palatinus L. // Z. Krist. 2014. V. 229. P. 345. https://doi.org/10.1515/zkri-2014-1737
  12. Makarova I.P., Isakova N.N., Kalyukanov A.I., Komornikov V.A. // Crystallography Reports. 2023. V. 68. P. 1055. https://doi.org/10.1134/s1063774523600795
  13. Makarova I.P., Isakova N.N., Kalyukanov A.I. et al. // Acta Cryst. B. 2024. V. 80. P. 201. https://doi.org/10.1107/s2052520624003470

Қосымша файлдар

Қосымша файлдар
Әрекет
1. JATS XML
2. Fig. 1. Registered total intensity Ip (a) and diffraction reflection intensity (integrated intensity) Is (b).

Жүктеу (73KB)
3. Fig. 2. Experimental frame read from the mar345 detector. The insets show enlarged images of weak reflections.

Жүктеу (592KB)
4. Fig. 3. Averaging the background over 10 (a) and 60 (b) frames.

Жүктеу (482KB)
5. Fig. 4. Application of the moving average method to a two-dimensional data array.

Жүктеу (92KB)
6. Fig. 5. Registered frame before background subtraction (left) and after (right) (a); reflection region before background subtraction (left) and after (right) (b); reflection profile before background subtraction (1), averaged background (2) and reflection profile after background subtraction (3) (c).

Жүктеу (864KB)
7. Fig. 6. The main motif of the structure of Cs4(HSO4)3(H2PO4) crystals. Hydrogen bonds are shown, including those with dynamically disordered H3 positions.

Жүктеу (102KB)

© Russian Academy of Sciences, 2025