Author Details

Rogozhin, A. E.

Issue	Section	Title	File
Vol 53, No 1 (2024)	TECHNOLOGIES	Interconnects Materials for Integrated Circuit Technology Below 5 Nm Node
Vol 52, No 5 (2023)	INSTRUMENTATION	Neuromorphic Systems: Devices, Architecture, and Algorithms
Vol 52, No 2 (2023)	ЛИТОГРАФИЯ	Cross Sections of Scattering Processes in Electron-Beam Lithography
Vol 52, No 2 (2023)	INSTRUMENTATION	Oxide Memristors for ReRAM: Approaches, Characteristics, and Structures
Vol 54, No 1 (2025)	MODELING	Calculation of distributions of electron beam energy absorbed in PMMA and Si using various scattering models
Vol 54, No 2 (2025)	NANOSTRUCTURES	Electrical characteristics of ruthenium lines with a cross-sectional area less than 1000 nm²
Vol 54, No 2 (2025)	INSTRUMENTATION	Ferroelectric transistors: operating principles, materials, applications
Vol 54, No 3 (2025)	DIAGNOSTICS	Structure of thin titanium nitride films deposited by magnetron sputtering