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Mikroèlektronika
ISSN 0544-1269 (Print)
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Keywords Förster effect bipolar transistor diagnostics etching gas temperature ionization kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization powerful LDMOS quantum dot reduced electric field strength resistive switching silicon silicon-on-insulator technology specific power
Current Issue

Vol 54, No 4 (2025)

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Keywords Förster effect bipolar transistor diagnostics etching gas temperature ionization kinetics magnetron sputtering mechanism memristor modeling molecular beam epitaxy plasma polymerization powerful LDMOS quantum dot reduced electric field strength resistive switching silicon silicon-on-insulator technology specific power
Current Issue

Vol 54, No 4 (2025)

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  • Articles
  • DIAGNOSTICS
  • INSTRUMENTATION
  • MEMRISTORS
  • MODELING
  • NANOSTRUCTURES
  • NANOTRANSISTORS
  • NEUROMORPHIC SYSTEMS
  • TECHNOLOGIES
  • ИСКУССТВЕННЫЙ ИНТЕЛЛЕКТ
  • КВАНТОВЫЕ ТЕХНОЛОГИИ
  • ЛИТОГРАФИЯ
  • МОДЕЛИРОВАНИЕ ТЕХНОЛОГИЧЕСКИХ ПРОЦЕССОВ
  • МОДЕЛИРОВАНИЕ ПРИБОРОВ
  • МОДЕЛИРОВАНИЕ ТЕХНОЛОГИЧЕСКИХ ПРОЦЕССОВ
  • МЭМС-УСТРОЙСТВА
  • МЭМС–УСТРОЙСТВА
  • НАДЕЖНОСТЬ
  • ПАМЯТЬ
  • ПЛАЗМЕННЫЕ ТЕХНОЛОГИИ
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  • УСТРОЙСТВА

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